products overview
   34XX Single Head Tester
      3400E
      3401E
      3402E
      3403E
      3442E
      3451E
      3462E
      3464E
   36XX Dual Head Tester
   IFXX Handler/Prober Interfaces
   AMX400 Mixed Signal Tester

34XX

Bipolar/FET/Diode Single Head Test System

3400E: Single Test Head System for 2, 3, 4+ Lead Devices
3401E: Single Test Head System optimized for 2 Lead Devices
3402E: Dual 3400 Systems in One Rack
3403E: Dual 3401 Systems in One Rack

FEATURES: